ページ更新: 2005-08-20 (土) (6370日前)
2005-08-20 smartmontoolsのインストールと設定。 OSはDebian GNU/Linux 3.1(Sarge) 目次 [編集]インストール ## apt-get install smartmontools (略)[編集] 動作確認 ## smartctl /dev/hda smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen Home page is http://smartmontools.sourceforge.net/ Warning! Drive Identity Structure error: invalid SMART checksum. SMART support is: Unavailable - device lacks SMART capability. A mandatory SMART command failed: exiting. To continue, add one or more '-T permis sive' options.
WDC WD400AB-32BVA0 # smartctl /dev/hdb smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen Home page is http://smartmontools.sourceforge.net/ SMART Disabled. Use option -s with argument 'on' to enable it. # smartctl -s on /dev/hdb smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF ENABLE/DISABLE COMMANDS SECTION === SMART Enabled. # smartctl -a /dev/hdb smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: WDC WD400AB-32BVA0 Serial Number: WD-WMA7F1017041 Firmware Version: 21.01H21 Device is: In smartctl database [for details use: -P show] ATA Version is: 5 ATA Standard is: Exact ATA specification draft version not indicated Local Time is: Fri Aug 19 20:11:53 2005 JST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (2376) seconds. Offline data collection capabilities: (0x3b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 42) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 200 200 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0007 105 101 021 Pre-fail Always - 3841 4 Start_Stop_Count 0x0032 099 099 040 Old_age Always - 1063 5 Reallocated_Sector_Ct 0x0032 194 194 112 Old_age Always - 23 7 Seek_Error_Rate 0x000b 200 200 051 Pre-fail Always - 0 9 Power_On_Hours 0x0032 069 069 000 Old_age Always - 22954 10 Spin_Retry_Count 0x0013 100 100 051 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0013 100 100 051 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 1039 196 Reallocated_Event_Count 0x0032 178 178 000 Old_age Always - 22 197 Current_Pending_Sector 0x0012 200 200 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0012 200 200 000 Old_age Always - 0 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x0009 200 200 051 Pre-fail Offline - 0 SMART Error Log Version: 1 ATA Error Count: 3 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 3 occurred at disk power-on lifetime: 851 hours (35 days + 11 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 00 50 08 bd a0 f9 e1 at LBA = 0x01f9a0bd = 33136829 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 30 00 80 0d a7 40 e0 00 00:06:52.550 WRITE SECTOR(S) 30 00 08 91 5f 05 e0 00 00:06:36.450 WRITE SECTOR(S) 30 00 08 01 5f 05 e0 00 00:06:20.350 WRITE SECTOR(S) 30 00 08 bd a0 f9 e1 00 00:06:04.300 WRITE SECTOR(S) 30 00 08 6d 7d 65 e0 00 00:05:48.200 WRITE SECTOR(S) Error 2 occurred at disk power-on lifetime: 895 hours (37 days + 7 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 00 50 08 94 a1 2d a0 at LBA = 0x002da194 = 2990484 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ca 00 08 ed 7a 30 e0 00 00:07:42.750 WRITE DMA ca 00 08 ed 7a 30 e0 00 00:07:42.750 WRITE DMA ca 00 01 ad 2b 41 e2 00 00:07:37.600 WRITE DMA ca 00 02 8d 2b 41 e2 00 00:07:36.600 WRITE DMA ca 00 24 6d 84 55 e2 00 00:07:35.600 WRITE DMA Error 1 occurred at disk power-on lifetime: 642 hours (26 days + 18 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 00 50 08 8e a1 2d e0 at LBA = 0x002da18e = 2990478 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 30 00 08 15 29 07 e0 00 00:22:35.000 WRITE SECTOR(S) 30 00 08 15 29 07 e0 00 00:22:35.000 WRITE SECTOR(S) 30 00 08 15 29 07 e0 00 00:22:31.950 WRITE SECTOR(S) 30 00 08 0d fc 6f e3 00 00:22:16.450 WRITE SECTOR(S) 30 00 08 0d fc 6f e3 00 00:22:01.400 WRITE SECTOR(S) SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Device does not support Selective Self Tests/Logging #[編集] 設定 #/etc/smartd.confを編集 作成中 /etc/default/smartmontools # /etc/init.d/smartmontools Usage: /etc/init.d/smartmontools {start|stop|restart|reload|force-reload} # /etc/init.d/smartmontools restart Not starting S.M.A.R.T. daemon smartd, disabled via /etc/default/smartmontools # /etc/init.d/smartmontools restart Restarting S.M.A.R.T. daemon: smartd. # man smartctl 作成中 |